Electromagnetic characterization of carbon nanotube films by a two-point evanescent microwave method

被引：7

作者：

Kozlowski, G. ^{[1
,3
]}

Kleismit, R. ^{[1
]}

Boeckl, J. ^{[2
]}

Campbell, A. ^{[2
]}

Munbodh, K. ^{[1
]}

Hopkins, S. ^{[3
]}

Koziol, K. ^{[3
]}

Peterson, T. ^{[2
]}

机构：

[1] Wright State Univ, Dept Phys, Dayton, OH 45435 USA

[2] USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA

[3] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

来源：

PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | 2009年 / 41卷 / 08期

关键词：

Carbon nanotube film; Evanescent microwave microscopy; Permittivity; COMPLEX PERMITTIVITY; SILICON-CARBIDE; MICROSCOPY;

D O I：

10.1016/j.physe.2009.04.034

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Electromagnetic characterization of carbon nanotube (CNT) films fabricated by thermal decomposition of silicon carbide (SiC) has been performed. A near-field microwave microscope is used to measure the real and imaginary parts of the complex permittivity of CNT films through the frequency shift and the change in reciprocal quality factor between two extreme positions of an evanescent microwave probe tip (in contact with the sample, and away from interaction with it). A theoretical two-point model is proposed to confirm experimental data, which shows poor conductivity of the CNT film. A comparison of our results with existing theoretical models and experimental data is presented. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1539 / 1544

页数：6

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