The reversible transformation between Cu2(In,Sn) and Cu(In,Sn)2 compounds during solid-state aging

被引:0
|
作者
Liu, Zhi-Quan [1 ]
Tian, Fei-Fei [1 ]
机构
[1] Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
来源
2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT) | 2014年
关键词
In-48Sn solder; Interfacial reaction; Intermetallic compound; Phase transformation; SOLDER;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, phase transformations at the interfaces between two nearly mutually insoluble elementary substances, In-48Sn solder and Cu, were investigated during serial solid-state aging process. The reversible phase transformation between Cu-2(In,Sn) and Cu(In,Sn)(2) compounds were observed, which are extremely rare to occur in one and the same system. The corresponding interfacial reactions were discussed according to physicochemical approach in detail. It was concluded that the diffiision ability of Cu and In,Sn atoms dominated different transformations at different temperatures. When the diffusion ability of lie.S'n atoms is stronger than that of Cu, Cu-2(In,Sn) transforms into Cu(In,Sn), while when the diffusion ability of Cu atoms is stronger than that of In/Sn, Cu(In,Sn)(2) transforms into Cu-2(In,Sn). The diffusion coefficients of Cu and In atoms at different temperatures on Cu substrate can be estinutted by the growth kinetics of the compound layers.
引用
收藏
页码:425 / 428
页数:4
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