A Glance at Device Stability in Load-Pull Measurement Setups

被引：0

作者：

Ceylan, Osman ^{[1
]}

Dominguez, John J. ^{[1
]}

Esposito, Giampiero ^{[1
]}

机构：

[1] Maury Microwave, 2900 Inland Empire Blvd, Ontario, CA 91164 USA

来源：

2022 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC) | 2022年

关键词：

load-pull; source-pull; device characterization; stability;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Source-pull and load-pull techniques are widely used to characterize and test RF transistors. The measurement system varies source and load impedances to evaluate the performance of DUT. However, RF transistors are not unconditionally stable due to their physical structures. Therefore, they tend to oscillate during source-pull and load-pull measurements. A load-pull setup usually consists of couplers, tuners, bias-tees, circulators, and driver amplifiers. These components might cause resonances and trigger oscillations during measurements. In this study, the frequency response of a passive load-pull setup is analyzed in a wide range to understand the effect of measurement setup equipment on DUT's stability. The measured results show a considerable impedance variation outside of the operation band. Some solutions are recommended, and the necessity of new equipment is discussed.

引用

页码：190 / 192

页数：3

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