Cadmium-doped Ge oxide and Zn oxide thin films were deposited by RF magnetron sputtering. The electrical and optical properties of these films were investigated. All deposited films except for highly Cd-doped Ge oxide were transparent to visible light. Hydrogen ion implantation reduced the resistivity of the films, although the optical transmittance for visible light did not change significantly. The enhancement of conductivity could be attributed to the increase in carrier density by the hydrogen introduction.
机构:
Cent Glass Co Ltd, Glass Res Ctr, Matsusaka City, Mie 5150001, JapanCent Glass Co Ltd, Glass Res Ctr, Matsusaka City, Mie 5150001, Japan
Kato, Kazuhiro
Omoto, Hideo
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Cent Glass Co Ltd, Glass Business Planning & Dev Dept, Chiyoda Ward, Tokyo 1010054, JapanCent Glass Co Ltd, Glass Res Ctr, Matsusaka City, Mie 5150001, Japan
Omoto, Hideo
Yonekura, Masaaki
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Cent Glass Co Ltd, Glass Res Ctr, Matsusaka City, Mie 5150001, JapanCent Glass Co Ltd, Glass Res Ctr, Matsusaka City, Mie 5150001, Japan