Interfacial Reaction and Microstructure Evolution of Sn-9Zn/Ni(Cu) Solder Joints

被引:2
|
作者
Zhu, Xuewei [1 ]
Peng, Jian [2 ]
Wei, Xiaofeng [1 ]
Yan, Pengpeng [1 ]
Wang, Fu [1 ]
机构
[1] Northwest A&F Univ, Coll Mech & Elect Engn, Yangling 712100, Shaanxi, Peoples R China
[2] Cent S Univ, Sch Mat Sci & Engn, Changsha 410083, Hunan, Peoples R China
关键词
interfacial reaction; intermetallic compound; Sn-9Zn solder; Ni(Cu) substrates; PHASE-EQUILIBRIA; INTERMETALLIC COMPOUNDS; NI; CU; ALLOY;
D O I
10.3390/met9050604
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Sn-9Zn solder is a promising Pb-free solder, but it tends to form bulky intermetallic compounds (IMC) grains at the interface when soldered with common simple metal Cu or Ni substrates. Interfacial reaction between Sn-9Zn solder and Ni(Cu) solid solution substrates at 250 degrees C and 350 degrees C were systematically probed in this study. Results showed that when soldered at 250 degrees C, a Ni5Zn21 layer is formed at Sn-Zn/Ni-20Cu and Sn-Zn/Ni-40Cu joints; and Ni2Sn2Zn + Cu5Zn8 and Cu5Zn8 phases are formed in Sn-Zn/Ni-60Cu and Sn-Zn/Ni-80Cu joints, respectively. Fine-grained IMCs formed at the interface are formed even when the soldered time is prolonged to 16 h. This result indicates that Ni(Cu) solid solution substrates inhibit the rapid growth of IMC at the Sn-Zn/Ni-Cu interface. Ni(Cu) solid solution substrate can also provide various combinations of reaction products at the Sn-Zn/Ni-Cu joints. The Ni5Zn21 transfers to Ni2Sn2Zn + Cu5Zn8 phases when the Cu content increased to 60%, and a bi-layered structure Ni2Sn2Zn + Cu5Zn8 IMCs was formed in Sn-Zn/Ni(Cu) joints at 350 degrees C regardless of the Cu content in Ni(Cu) substrate (20-80%). These results would provide an effective support in designing Sn-Zn soldering system with optimized IMC layer to improve mechanical performance.
引用
收藏
页数:11
相关论文
共 50 条
  • [31] Effects of Current Density on Liquid-Solid Electromigration Behavior of Cu/Sn-9Zn/Ni Solder Joint
    Chen Leida
    Zhang Zhijie
    Huang Mingliang
    Li Baoxia
    RARE METAL MATERIALS AND ENGINEERING, 2020, 49 (05) : 1629 - 1636
  • [32] Reliability studies of Sn-9Zn/Cu and Sn-9Zn-0.06Nd/Cu joints with aging treatment
    Hu, Yu-hua
    Xue, Song-bai
    Ye, Huan
    Xiao, Zheng-xiang
    Gao, Li-li
    Zeng, Guang
    MATERIALS & DESIGN, 2012, 34 : 768 - 775
  • [33] Interfacial characteristics and microstructural evolution of Sn-6.5Zn solder/Cu substrate joints during aging
    Zhao Guo-ji
    Sheng Guang-min
    Wu Li-li
    Yuan Xin-jian
    TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 2012, 22 (08) : 1954 - 1960
  • [34] Effect of Temperature and Solder Thickness on Interfacial Reaction in Cu/Sn/Ni Solder Joints Formed by TLP Bonding
    Wei, Hong
    Zhang, Zhi-jie
    Gao, Xing
    Shi, Quan
    Zhou, Xu
    2022 23RD INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2022,
  • [35] Interfacial microstructure evolution and shear behavior of Au-20Sn/(Sn)Cu solder joints bonded at 250°C
    Liu, Wensheng
    Wang, Yikai
    Ma, Yunzhu
    Yu, Qiang
    Huang, Yufeng
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2016, 651 : 626 - 635
  • [36] Corrosion measurement on shear strength of Cu/Sn-9Zn/Cu lap joints
    Affendy, Muhammad Ghaddafy
    Yahaya, Muhamad Zamri
    Ani, Fakhrozi Che
    Mohamad, Ahmad Azmin
    MEASUREMENT, 2015, 66 : 195 - 203
  • [37] Interfacial. Reactions between the Sn-9Zn Solder and Au/Ni/SUS304 Multi-layer Substrate
    Yen, Yee-Wen
    Jao, Chien-Chung
    Chao, Kuo-Sing
    Fu, Shu-Mei
    WORLD CONGRESS ON ENGINEERING, WCE 2011, VOL II, 2011, : 1455 - 1459
  • [38] Microstructure Evolution and Shear Strength Study of Sn-9Zn and Sn-8Zn-3Bi on Cu Substrate
    Mayappan, Ramani
    Ahmad, Zainal Arifin
    TRANSACTIONS ON ELECTRICAL AND ELECTRONIC MATERIALS, 2024, 25 (01) : 48 - 58
  • [39] The influence of Ni and Zn additions on microstructure and phase transformations in Sn-0.7Cu/Cu solder joints
    Zeng, Guang
    McDonald, Stuart D.
    Gu, Qinfen
    Terada, Yasuko
    Uesugi, Kentaro
    Yasuda, Hideyuki
    Nogita, Kazuhiro
    ACTA MATERIALIA, 2015, 83 : 357 - 371
  • [40] Interfacial reaction between Sn-0.7Cu (-Ni) solder and Cu substrate
    Nishikawa, H
    Piao, JY
    Takemoto, T
    JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (05) : 1127 - 1132