Correlation between macroscopic properties and microscopic parameters versus stress in tetragonal Pb(Mg1/3Nb2/3)0.6Ti0.4O3 ferroelectric ceramics

The influence of domain switching on the evolution of macroscopic polarization in the ferroelectric Pb(Mg1/3Nb2/3)(1-x)TixO3 material was studied. Domain switching during the application of a compressive stress was evaluated using in situ x-ray diffraction. It was found that stress depolarization was controlled by 90 degrees domain reorientation. Details on domain switching quantification were given for samples with their surface parallel to the polar axis. From x-ray data, the macroscopic polarization versus stress was also simulated, underlying a strong correlation between microscopic parameters and macroscopic properties. This simulation was based on the assumption that the dipolar moment of the unit cell does not change with stress. The x-ray diffraction was established as a viable nondestructive technique for the determination of remnant polarization. (c) 2006 American Institute of Physics.