Picosecond soft x-ray absorption measurement of the photoinduced insulator-to-metal transition in VO2 -: art. no. 153106

被引:70
作者
Cavalleri, A [1 ]
Chong, HHW
Fourmaux, S
Glover, TE
Heimann, PA
Kieffer, JC
Mun, BS
Padmore, HA
Schoenlein, RW
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source Div, Berkeley, CA 94720 USA
[3] Univ Quebec, INRS Energie & Mat, Varennes, PQ, Canada
[4] Univ Calif Berkeley, Adv Sci & Technol Grad Grp, Berkeley, CA 94720 USA
关键词
D O I
10.1103/PhysRevB.69.153106
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We directly measure the photoinduced insulator-to-metal transition in VO2 using time-resolved near-edge x-ray absorption. Picosecond pulses of synchrotron radiation are used to detect the redshift in the vanadium L-3 edge at 516 eV, which is associated with the transient collapse of the low-temperature band gap. We identify a two-component temporal response, corresponding to an ultrafast transformation over a 50 nm surface layer, followed by 40 m/s thermal growth of the metallic phase into the bulk.
引用
收藏
页码:153106 / 1
页数:4
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