共 7 条
Magnetic Force Microscopy Observation of Perpendicular Recording Head Remanence
被引:1
作者:
Dilekrojanavuti, P.
[1
]
Saengkaew, K.
[2
]
Cheowanish, I.
[2
]
Damrongsak, B.
[1
]
机构:
[1] Silpakorn Univ, Fac Sci, Dept Phys, Bangkok 73000, Nakhon Pathom, Thailand
[2] Western Digital Thailand Co Ltd, Bang Pa In 13160, Ayutthaya, Thailand
来源:
SIAM PHYSICS CONGRESS 2017 (SPC2017)
|
2017年
/
901卷
关键词:
D O I:
10.1088/1742-6596/901/1/012091
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
In this work, magnetic force microscopy (MFM) was utilized to observe the magnetic write head remanence, which is the remaining out-of-plane magnetic field on magnetic write heads after a write current is turned off. This remnant field can write unwanted tracks or erase written tracks on a magnetic media. The write head remanence can also occur from device and slider fabrication, either by applying current to the write coil during the inspection or biasing the external magnetic field to magnetic recording heads. This remanence can attract magnetic nanoparticles, which is suspended in cleaning water or surrounding air, and cause device contamination. MFM images were used to examine locations of the remnant field on the surface of magnetic recording heads. Experimental results revealed that the remanence occurred mostly on the shield and is dependent on the initial direction of magnetic moments. In addition, we demonstrated a potential use of MFM imaging to investigate effects of different etching gases on the head remanence.
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