Analytical Model of Perturbed EMF in a Transmit-Receive Coil System Due to Thin Flaws

被引：1

作者：

Baskaran, Prashanth ^{[1
]}

Pasadas, Dario ^{[1
]}

Ribeiro, Artur ^{[1
]}

Ramos, Helena ^{[1
]}

机构：

[1] Univ Lisbon, Inst Telecomunicacoes, Inst Super Tecn, P-1049001 Lisbon, Portugal

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2022年 / 58卷 / 05期

关键词：

Electric fields; Conductors; Receivers; Mathematical models; Electric potential; Magnetic separation; Finite element analysis; Boundary element method (BEM); eddy current testing (ECT); induced electromotive force (EMF);

D O I：

10.1109/TMAG.2022.3152058

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This work proposes a model based on the semianalytical boundary element method (BEM) to predict the perturbation of the voltage induced in an eddy current coil due to narrow opening flaws that are usually encountered in eddy current nondestructive tests. The modeling is performed for rectangular narrow opening flaws that are located on the surface of an aluminum plate of finite thickness. The excitation to the coil varies time harmonically and the BEM results are corroborated by experiments performed in a controlled environment in the laboratory.

引用

页数：5

共 12 条

[1]

Banos A., 1953, The horizontal electric dipole in a conducting half-space

[2]

Baskaran P., 2021, PROC TELECOMS C CONF, P1

[3] EDDY-CURRENT INTERACTION WITH AN IDEAL CRACK .1. THE FORWARD PROBLEM [J].