Effect of chain length of self-assembled monolayers on adhesion force measurement by AFM

被引：14
|
作者：
Guo, Li-Ya [1 ]
Zhao, Ya-Pu [1 ]
机构：
[1] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China
来源：
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 2006年 / 20卷 / 12期
基金：
中国国家自然科学基金;
关键词：
quasi-continuum model; adhesion; SAMs; chain length; Lennard-Jones potential; van der Waals force; pull-off point;
D O I：
10.1163/156856106778456555
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
It has been confirmed experimentally that the adhesion force measured between an atomic force microscope (AFM) tip and the self-assembled monolayers (SAMs) has a direct correlation with the chain length of SAMs, and that the adhesion force decreases with the increase of the chain length. In this paper, a theoretical model is put forward to calculate the adhesion force between the AFM tip and the SAMs by integrating the Lennard-Jones potential. The theoretical results are in good agreement with the existing experimental results.
引用
收藏
页码：1281 / 1293
页数：13
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