Crystalline Silicon Solar Cells with Thin Silicon Passivation Film Deposited prior to Phosphorous Diffusion

被引:2
作者
Li, Ching-Tao [1 ]
Hsieh, Fangchi [2 ]
Yan, Shi [2 ]
Wan, Cuifeng [2 ]
Liu, Yakun [2 ]
Chen, Jing [2 ]
Wang, Likarn [1 ]
机构
[1] Natl Tsing Hua Univ, Inst Photon Technol, Hsinchu 30013, Taiwan
[2] Jiangsu Aide Solar Energy Technol Co Ltd, Xuzhou 221121, Peoples R China
关键词
SURFACE RECOMBINATION; BULK;
D O I
10.1155/2014/491475
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We demonstrate the performance improvement of p-type single-crystalline silicon (sc-Si) solar cells resulting from front surface passivation by a thin amorphous silicon (a-Si) film deposited prior to phosphorus diffusion. The conversion efficiency was improved for the sample with an a-Si film of similar to 5 nm thickness deposited on the front surface prior to high-temperature phosphorus diffusion, with respect to the samples with an a-Si film deposited on the front surface after phosphorus diffusion. The improvement in conversion efficiency is 0.4% absolute with respect to a-Si film passivated cells, that is, the cells with an a-Si film deposited on the front surface after phosphorus diffusion. The new technique provided a 0.5% improvement in conversion efficiency compared to the cells without a-Si passivation. Such performance improvements result from reduced surface recombination as well as lowered contact resistance, the latter of which induces a high fill factor of the solar cell.
引用
收藏
页数:8
相关论文
共 27 条
[1]  
Altermatt P P., 2006, Proceedings of the 21st European Photovoltaic Solar Energy Conference, P647
[2]   STRUCTURAL INFORMATION FROM THE RAMAN-SPECTRUM OF AMORPHOUS-SILICON [J].
BEEMAN, D ;
TSU, R ;
THORPE, MF .
PHYSICAL REVIEW B, 1985, 32 (02) :874-878
[3]  
Book F., 2008, 23rd European Photovoltaic Solar Energy Conference and Exhibition, P1546, DOI [10.4229/23rdEUPVSEC2008-2CV.4.65, DOI 10.4229/23RDEUPVSEC2008-2CV.4.65]
[4]   Ultra-high quality surface passivation of crystalline silicon wafers in large area parallel plate reactor at 40 MHz [J].
Damon-Lacoste, J. ;
Fesquet, L. ;
Olibet, S. ;
Ballif, C. .
THIN SOLID FILMS, 2009, 517 (23) :6401-6404
[5]   Simulation and study of the influence of the buffer intrinsic layer, back-surface field, densities of interface defects, resistivity of p-type silicon substrate and transparent conductive oxide on heterojunction with intrinsic thin-layer (HIT) solar cell [J].
Dao, Vinh Ai ;
Heo, Jongkyu ;
Choi, Hyungwook ;
Kim, Yongkuk ;
Park, Seungman ;
Jung, Sungwook ;
Lakshminarayan, Nariangadu ;
Yi, Junsin .
SOLAR ENERGY, 2010, 84 (05) :777-783
[6]  
Dastgheib-Shirazi A., 2008, P 23 EUR PHOT SOL EN, P1197
[7]   Stretched-exponential a-Si:H/c-Si interface recombination decay [J].
De Wolf, Stefaan ;
Olibet, Sara ;
Ballif, Christophe .
APPLIED PHYSICS LETTERS, 2008, 93 (03)
[8]   Requirements of PECVD SiNx:H layers for bulk passivation of mc-Si [J].
Dekkers, H. F. W. ;
De Wolf, S. ;
Agostinelli, G. ;
Duerinckx, F. ;
Beaucarne, G. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2006, 90 (18-19) :3244-3250
[9]  
FUJIWARA H, 2007, J APPL PHYS, V101
[10]   Very low bulk and surface recombination in oxidized silicon wafers [J].
Kerr, MJ ;
Cuevas, A .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2002, 17 (01) :35-38