In-situ X-ray observation of local structural change during crystallization

被引：0

作者：

Nishi, T ^{[1
]}

Uematsu, K ^{[1
]}

Sato, S ^{[1
]}

Matsubara, E ^{[1
]}

Inoue, A ^{[1
]}

Waseda, Y ^{[1
]}

机构：

[1] Tohoku Univ, Grad Sch, Dept Mat Proc, Sendai, Miyagi 9808577, Japan

来源：

PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II | 2001年

关键词：

supercooled liquid; Pd20Ni10Cu30P20; alloy; X-ray diffraction; Debye-Scherrer camera; crystallization;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An X-ray apparatus for in-situ observation of a scattering intensity of supercooled liquid at an elevated temperature as a function of annealing time has been developed in combination with an in-house X-ray source and a curved position sensitive proportional counter (PSPC). By adopting the Debye-Scherrer camera geometry, a quantitative intensity profile of a silica glass of 2 mm diameter was obtained for 10 s and similarly that of a Pd40Ni10Cu30P20 amorphous wire of 0.2 mm diameter for 100 s. A change of local atomic structures during annealing in supercooled Pd40Ni10Cu30P20 liquid has been determined.

引用

页码：55 / 58

页数：4

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