High-sensitivity small-angle sensor based on surface plasmon resonance technology and heterodyne interferometry

被引:44
作者
Wang, Shinn-Fwu
Chiu, Ming-Hung
Lai, Chih-Wen
Chang, Rong-Seng
机构
[1] Ching Yun Univ, Dept Elect Engn, Jhongli 320, Taoyuan, Taiwan
[2] Natl Formosa Univ, Dept Electroopt Engn, Huwei 632, Yunlin, Taiwan
[3] Natl Cent Univ, Inst Opt Sci, Jhongli 320, Taoyuan, Taiwan
关键词
D O I
10.1364/AO.45.006702
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A high-sensitivity small-angle sensor based on surface plasmon resonance technology and heterodyne interferometry is proposed that uses a new technique with two right-angle prisms. Interestingly, the technique provides a novel method for designing small-angle sensors with high sensitivity and high resolution. Its theoretical resolution can reach 1.2 X 10(-7) rad over the measurement range of -0.15 degrees <= theta <= 0.15 degrees. The method has some merits, e.g., a simple optical setup, easy operation, high resolution, high sensitivity, and rapid measurement. Its feasibility is demonstrated. (c) 2006 Optical Society of America.
引用
收藏
页码:6702 / 6707
页数:6
相关论文
共 22 条
[1]   Application of a liquid sensor based on surface plasma wave excitation to distinguish methyl alcohol from ethyl alcohol [J].
Cheng, YC ;
Su, WK ;
Liou, JH .
OPTICAL ENGINEERING, 2000, 39 (01) :311-314
[2]   Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry [J].
Chiu, MH ;
Wang, SF ;
Chang, RS .
APPLIED OPTICS, 2004, 43 (29) :5438-5442
[3]   Angle measurement using total-internal-reflection heterodyne interferometry [J].
Chiu, MH ;
Su, DC .
OPTICAL ENGINEERING, 1997, 36 (06) :1750-1753
[4]   Improved technique for measuring small angles [J].
Chiu, MH ;
Su, DC .
APPLIED OPTICS, 1997, 36 (28) :7104-7106
[5]   DETERMINATION OF DIELECTRIC PERMITTIVITY AND THICKNESS OF A METAL LAYER FROM A SURFACE-PLASMON RESONANCE EXPERIMENT [J].
DEBRUIJN, HE ;
KOOYMAN, RPH ;
GREVE, J .
APPLIED OPTICS, 1990, 29 (13) :1974-1978
[6]   Angle measurement using surface-plasmon-resonance heterodyne interferometry: a new method [J].
Guo, JH ;
Zhu, ZM ;
Deng, WM ;
Shen, S .
OPTICAL ENGINEERING, 1998, 37 (11) :2998-3001
[7]   ANGLE MEASUREMENT BASED ON THE INTERNAL-REFLECTION EFFECT AND THE USE OF RIGHT-ANGLE PRISMS [J].
HUANG, PS ;
NI, J .
APPLIED OPTICS, 1995, 34 (22) :4976-4981
[8]   Angle measurement based on the internal-reflection effect using elongated critical-angle prisms [J].
Huang, PS ;
Ni, J .
APPLIED OPTICS, 1996, 35 (13) :2239-2241
[9]   Use of thin films for high-sensitivity angle measurement [J].
Huang, PSS .
APPLIED OPTICS, 1999, 38 (22) :4831-4836
[10]   DETERMINATION OF OPTICAL CONSTANTS OF METALS BY EXCITATION OF SURFACE PLASMONS [J].
KRETSCHM.E .
ZEITSCHRIFT FUR PHYSIK, 1971, 241 (04) :313-&