Pulsed photothermal deflection with a top-hat beam excitation

被引：6
|
作者：
Li, Bincheng
Blaschke, Holger
Ristau, Detlev
机构：
[1] Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Sichuan, Peoples R China
[2] Laser Zentrum Hannover EV, D-30419 Hannover, Germany
来源：
JOURNAL OF APPLIED PHYSICS | 2006年 / 100卷 / 05期
关键词：
D O I：
10.1063/1.2337253
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A top-hat beam excitation is used in pulsed photothermal deflection (PTD) experiments. Based on the Fresnel diffraction model a theory is developed to describe accurately the PTD amplitude obtained with the top-hat beam excitation. The comparison between the theoretical PTD amplitudes achieved with a Gaussian and a top-hat beam excitation shows that the use of top-hat beam excitation improves the measurement sensitivity of the PTD technique. Good agreement between theoretical calculations and experimental results is obtained. (c) 2006 American Institute of Physics.
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页数：6
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