The interpretation of tapping mode images of polymer surfaces in Atomic Force Microscopy.

被引：0

作者：

Llewellyn, JP ^{[1
]}

Sayers, P ^{[1
]}

机构：

[1] Univ Wales, SEECS, Bangor LL57 1UT, Gwynedd, Wales

来源：

ELECTROSTATICS 1999 | 1999年 / 163卷

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The differential equation describing the motion of a vibrating AFM cantilever used in the tapping mode is solved numerically to find the phase of the vibrations. The effects of introducing a Coulomb interaction between the cantilever tip and the surface, and also an energy loss during the tapping process, are investigated.

引用

页码：403 / 406

页数：4

共 7 条

[1] NUMERICAL SIMULATIONS OF A SCANNING FORCE MICROSCOPE WITH A LARGE-AMPLITUDE VIBRATING CANTILEVER [J].