Electrometer preamplifier for scanning tunneling microscopy

被引：7
作者：
Chen, YP
Cox, AJ
Hagmann, MJ
Smith, HDA
机构：
[1] Dept. of Elec. and Comp. Engineering, Florida International University, Miami
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1996年 / 67卷 / 07期
关键词：
D O I：
10.1063/1.1147185
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An optimized current preamplifier, consisting of a shunt resistor followed by a high speed field-effect transistor input instrumentation amplifier, appears suitable for use in scanning tunneling microscopy. The preamplifier has a transimpedance of 100 M Omega, a measured 3 dB bandwidth of 200 kHz, low phase distortion, and excellent noise performance. (C) 1996 American Institute of Physics.
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页码：2652 / 2653
页数：2
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