Measurement of semiconductor laser gain and dispersion curves utilizing Fourier transforms of the emission spectra

被引：70

作者：

Hofstetter, D ^{[1
]}

Faist, J ^{[1
]}

机构：

[1] Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1999年 / 11卷 / 11期

关键词：

dispersion curves; Fourier transform; gain spectra; semiconductor lasers;

D O I：

10.1109/68.803049

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new technique for the measurement of semiconductor laser gain and dispersion spectra is presented. The technique is based on an analysis of the subthreshold emission spectrum by Fourier transforms. Applications of this method to AlGaInP-based interband laser diodes and mid-infrared intersubband quantum cascade lasers are discussed. A good agreement between the measured dispersion of the refractive index and tabulated values in the literature was found.

引用

页码：1372 / 1374

页数：3

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