Filamentation and linewidth enhancement factor in InGaAs quantum dot lasers

被引:61
作者
Smowton, PM [1 ]
Pearce, EJ
Schneider, HC
Chow, WW
Hopkinson, M
机构
[1] Cardiff Univ, Dept Phys & Astron, Cardiff CF24 3YB, S Glam, Wales
[2] Sandia Natl Labs, Semicond Mat & Device Sci Dept, Albuquerque, NM 87185 USA
[3] Univ Sheffield, EPSRC Cent Facil Semicond 3 5, Sheffield S1 3JD, S Yorkshire, England
关键词
D O I
10.1063/1.1516236
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report measurements of the near-field of broad-area lasers with quantum dot and quantum well active regions designed to emit at 1 mum. The quantum dot devices exhibit less filamentation than comparable quantum well devices, and exhibit a reduction in filamentation as the injection level is increased. This is consistent with a theory that includes the Coulomb coupling between dot and wetting-layer states on a microscopic level. The theory predicts a linewidth enhancement factor from -3 to 1, depending on carrier density and inhomogeneous broadening. (C) 2002 American Institute of Physics.
引用
收藏
页码:3251 / 3253
页数:3
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