Virtual prototyping in a Design-for-Reliability approach

被引：4

作者：

Barnat, Samed ^{[1
]}

Guedon-Gracia, Alexandrine ^{[2
]}

Fremont, Helene ^{[2
]}

机构：

[1] Univ Virtuelle Tunis, ISEFC, Tunis, Tunisia

[2] Univ Bordeaux, IMS Bordeaux, UMR 5218, F-33405 Talence, France

来源：

MICROELECTRONICS RELIABILITY | 2015年 / 55卷 / 9-10期

关键词：

Virtual prototyping; Design-for-Reliability; Silicon strength; MECHANICAL-PROPERTIES; DELAMINATION; PREDICTION;

D O I：

10.1016/j.microrel.2015.06.071

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The main purpose of the paper is to present a methodological approach combining experiments and simulations for virtual prototyping in a Design-for-Reliability approach. Two examples illustrate the methodology and the importance of a wise choice of the adequate failure criterion for numerical modelling. In the first example, the stress induced in silicon is axial whereas it is radial in the second case. Strength data recorded from three-point-bend tests have been regarded in the first case, whereas in the second case, ball-on-ring test results have been considered. (C) 2015 Elsevier Ltd. All rights reserved.

引用

页码：1849 / 1854

页数：6

共 15 条

[1]

Bamat S., 2012, MICROELECTRON RELIAB, V52, P2278

[2]

Barnat S., 2009, VIRTUAL PROTOTYPING

[3] Lifetime prediction on the base of mission profiles [J].