Analysis of open-loop tanlock carrier recovery for BPSK

被引：0

作者：

Kam, PY

Cheong, TM

机构：

[1] Department of Electrical Engineering, National University of Singapore, Singapore 119260

来源：

ELECTRONICS LETTERS | 1997年 / 33卷 / 06期

关键词：

phase shift keying; phase-locked loops;

D O I：

10.1049/el:19970326

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An approximate analysis, valid for high SNR, is presented for the probability density function of the phase tracking error of the open-loop tanlock carrier recovery structure for BPSK proposed in [1]. The result is verified by computer simulations, and enables the evaluation of error probability of the tanlock structure.

引用

页码：443 / 444

页数：2

共 4 条

[1]

KAM PY, 1986, IEEE T COMMUN, V34, P522

[2] APPROXIMATE RESULTS FOR THE BIT ERROR-PROBABILITY OF BINARY PHASE-SHIFT KEYING WITH NOISY PHASE REFERENCE [J].