Long-channel field-effect transistor with short-channel transistor properties

被引:0
|
作者
Karimov, A. V. [1 ]
Yodgorova, D. M. [1 ]
Abdulkhaev, O. A. [1 ]
机构
[1] Uzbek Acad Sci, Phys Tech Inst, Sci Prod Assoc Phys Sun, Tashkent 100084, Uzbekistan
关键词
Transient Response; Carrier Mobility; Field Effect Transistor; Impurity Distribution; Channel Thickness;
D O I
10.1134/S1063782614040137
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The typical parameters of samples of long-channel field-effect transistors and the results of measurement of their functional characteristics are presented. The possible distributions of the carrier mobility over the channel thickness are considered. The current-voltage characteristics of long-channel field-effect transistors with an arbitrary doping profile and carrier-mobility gradient are theoretically analyzed taking into account carrier velocity saturation.
引用
收藏
页码:481 / 486
页数:6
相关论文
共 50 条
  • [1] Long-channel field-effect transistor with short-channel transistor properties
    A. V. Karimov
    D. M. Yodgorova
    O. A. Abdulkhaev
    Semiconductors, 2014, 48 : 481 - 486
  • [2] SHORT-CHANNEL THRESHOLD DEPENDENCE OF THE INVERSION CHANNEL HETEROSTRUCTURE FIELD-EFFECT TRANSISTOR
    TAYLOR, GW
    KIELY, PA
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (10) : 1871 - 1873
  • [3] RF Performance of Short Channel Graphene Field-Effect Transistor
    Wu, Y. Q.
    Lin, Y. -M.
    Jenkins, K. A.
    Ott, J. A.
    Dimitrakopoulos, C.
    Farmer, D. B.
    Xia, F.
    Grill, A.
    Antoniadis, D. A.
    Avouris, Ph.
    2010 INTERNATIONAL ELECTRON DEVICES MEETING - TECHNICAL DIGEST, 2010,
  • [4] Dependences of short-channel effect on doping profiles for nanoscale metal-oxide-semiconductor field-effect transistor
    Shih, Chun-Hsing
    Lien, Chenhsin
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (5A): : 3959 - 3971
  • [5] Tunnel Field-Effect Transistor With Segmented Channel
    Park, Jaesoo
    Shin, Changhwan
    IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2019, 7 (01) : 621 - 625
  • [6] ON THE SHORT-CHANNEL THEORY FOR MOS-TRANSISTOR
    CONTI, M
    TURCHETTI, C
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (12) : 2657 - 2661
  • [7] Accurate extraction of excess channel thermal noise coefficient in berkeley short-channel insulated gate field-effect transistor model 4
    Inter-university Semiconductor Research Center , School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea, Republic of
    不详
    不详
    Jpn. J. Appl. Phys., 4 PART 2
  • [8] Accurate Extraction of Excess Channel Thermal Noise Coefficient in Berkeley Short-Channel Insulated Gate Field-Effect Transistor Model 4
    Jeon, Jongwook
    Lee, Jaehong
    Park, Chan Hyeong
    Lee, Hyunwoo
    Oh, Hansu
    Kang, Ho-Kyu
    Park, Byung-Gook
    Shin, Hyungcheol
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (04)
  • [9] An analytical model of short-channel effect for metal-oxide-semiconductor field-effect transistor with insulated shallow extension
    Shih, C.-H. (chshih@saturn.yzu.edu.tw), 1600, Japan Society of Applied Physics (43):
  • [10] Suppressed short-channel effect of double-gate metal oxide semiconductor field-effect transistor and its modeling
    Oka, Hideki
    Tanabe, Ryo
    Sadachika, Norio
    Yumisaki, Akihiro
    Miura-Mattausch, Mitiko
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (4B): : 2096 - 2100