Measurements of displacement and trapping force on micron-sized particles in optical tweezers system

被引：0
|
作者：
Guo, HL [1 ]
Yao, XC
Li, ZL
Cheng, BY
Han, XH
Zhang, DZ
机构：
[1] Chinese Acad Sci, Opt Phys Lab, Inst Phys, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Ctr Condensed Mtter Phys, Beijing 100080, Peoples R China
[3] Chinese Acad Sci, Inst Biophys, State Key Lab Biomacromol, Beijing 100101, Peoples R China
来源：
SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY | 2002年 / 45卷 / 07期
关键词：
optical tweezers; displacement; force;
D O I：
暂无
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
A high-stability optical tweezers equipped with a high-precision measurement system of displacement and force is set up. The results show that this combination can be used to carry out quantitative measurements of small displacements and forces for micron-sized spheres. The precision of measurements has reached nanometers and piconewtons, respectively.
引用
收藏
页码：919 / 925
页数：7
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