Built-in self-testing based on compressed 2-dimensional signature analysis

被引：2

作者：

Cai, CX ^{[1
]}

Wang, XT ^{[1
]}

Peng, YN ^{[1
]}

机构：

[1] Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China

来源：

2001 CIE INTERNATIONAL CONFERENCE ON RADAR PROCEEDINGS | 2001年

关键词：

built-in self-testing; signature analysis; faulty coverage ratio;

D O I：

10.1109/ICR.2001.984853

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The designing process of modem electronic systems demands high system reliability and maintainability. In order to perform fault detection, localization and isolation effectively, it is necessary to design a Built-In Self-Testing (BIST) module specific for the corresponding system. This paper presents a BIST method based on the compressed 2-dimensional signature analysis. The principle of compression and performance of test are discussed in detail. Using the presented method, a high Faulty Coverage Ratio (FCR) can be achieved with a short signature compressed in both time domain and space domain. Theoretical analysis shows that this method is reliable and it can be easily implemented in hardware.

引用

页码：885 / 888

页数：4

共 7 条

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