Reversed temperature-dependent propagation delay characteristics in nanometer CMOS circuits

被引:72
作者
Kumar, Ranjith [1 ]
Kursun, Volkan [1 ]
机构
[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA
关键词
high temperature speed; supply voltage scaling; temperature variations;
D O I
10.1109/TCSII.2006.882218
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The supply voltage to threshold voltage ratio is reduced with each new technology generation. The gate overdrive variation with temperature plays an increasingly important role in determining the speed characteristics of CMOS integrated circuits. The temperature-dependent propagation delay characteristics, as shown in this brief, will experience a complete reversal in the near future. Contrary to the older technology generations, the speed of circuits in a 45-nm CMOS technology is enhanced when the temperature is increased at the nominal supply voltage. Operating an integrated circuit at the prescribed nominal supply voltage is not preferable for reliable operation under temperature fluctuations. A design methodology based on optimizing the supply voltage for temperature-variation-insensitive circuit performance is proposed in this brief. The optimum supply voltage is 45% to 53% lower than the nominal supply voltage in a 180-nm CMOS technology. Alternatively, the optimum supply voltage is 15% to 35% higher than the nominal supply voltage in a 45-nm CMOS technology. The speed and energy tradeoffs in the supply voltage optimization technique are also presented.
引用
收藏
页码:1078 / 1082
页数:5
相关论文
共 9 条
[1]  
[Anonymous], 1999, BSIM3V3 2 2 MOSFET M
[2]  
[Anonymous], 2003, BSIM4 3 0 MOSFET MOD
[3]   Supply voltage scaling for temperature insensitive CMOS circuit operation [J].
Bellaouar, A ;
Fridi, A ;
Elmasry, MI ;
Itoh, K .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 1998, 45 (03) :415-417
[4]  
Borkar S, 2003, DES AUT CON, P338
[5]   New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation [J].
Cao, Y ;
Sato, T ;
Orshansky, M ;
Sylvester, D ;
Hu, CM .
PROCEEDINGS OF THE IEEE 2000 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2000, :201-204
[6]   The changing automotive environment: High-temperature electronics [J].
Johnson, RW ;
Evans, JL ;
Jacobsen, P ;
Thompson, JRR ;
Christopher, M .
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2004, 27 (03) :164-176
[7]  
KUMAR R, 2006, P ACM SIGDA GREAT LA, P410
[8]   CMOS design near the limit of scaling [J].
Taur, Y .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2002, 46 (2-3) :213-222
[9]  
Tsividis Y., 1999, OPERATION MODELING M, V2nd