Synchrotron-radiation-excited high-resolution soft X-ray emission and absorption spectroscopy for characterization of carbon materials

被引：0
|
作者：
Muramatsu, Y [1 ]
Hayashi, T [1 ]
机构：
[1] NTT, Integrated Informat & Energy Syst Labs, Musashino, Tokyo 1808585, Japan
来源：
NEW DIAMOND AND FRONTIER CARBON TECHNOLOGY | 1999年 / 9卷 / 02期
关键词：
synchrotron radiation; X-ray spectroscopy; electronic structure;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：169 / 172
页数：4
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