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Improvement of hydrogenated amorphous silicon germanium thin film solar cells by different p-type contact layer
被引:19
|作者:
Cho, Jaehyun
[1
]
Duy Phong Pham
[2
]
Jung, Junhee
[1
]
Shin, Chonghoon
[1
]
Park, Jinjoo
[2
]
Kim, Sangho
[1
]
Le, Anh Huy Tuan
[2
]
Park, Hyeongsik
[2
]
Iftiquar, S. M.
[2
]
Yi, Junsin
[1
,2
]
机构:
[1] Sungkyunkwan Univ, Dept Energy Sci, Suwon 440746, South Korea
[2] Sungkyunkwan Univ, Coll Informat & Commun Engn, Suwon 440746, South Korea
关键词:
a-SiGe:H thin film solar cells;
Hydrogenated microcrystalline silicon oxide;
p-type contact layer;
A-SIGE-H;
TRANSPARENT CONDUCTING OXIDE;
OPEN-CIRCUIT VOLTAGE;
MICROCRYSTALLINE SILICON;
WINDOW LAYER;
EFFICIENCY;
QUALITY;
DEPOSITION;
BUFFER;
ENHANCEMENT;
D O I:
10.1016/j.mssp.2015.10.006
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In this study, we report an appreciably increased efficiency from 6% up to 9.1% of hydrogenated amorphous silicon germanium (a-SiGe:H) thin film solar cells by using a combination of different p-doped window layers, such as boron doped hydrogenated amorphous silicon (p-a-Si:H), amorphous silicon oxide (p-a-SiOx:H), microcrystalline silicon (p-mu c-Si:H), and microcrystalline silicon oxide (p-mu c-SiOx:H). Optoelectronic properties and the role of these p-layers in the enhancement of a-SiGe:H cell efficiency were also examined and discussed. An improvement of 1.62 mA/cm(2) in the short-circuit current density (J(sc)) is attributed to the higher band gap of p-type silicon oxide layers. In addition, an increase in open-circuit voltage (V-oc) by 150 mV and fill factor (FF) by 6.93% is ascribed to significantly improved front TCO/p-layer interface contact. (C) 2015 Elsevier Ltd. All rights reserved.
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页码:480 / 484
页数:5
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