A method for the determination of a distributed fet noise model based on matched-source noise-figure measurements

被引：0
|
作者：
Maya, MC [1 ]
Lázaro, A [1 ]
Pradell, L [1 ]
机构：
[1] Univ Politecn Cataluna, Dept TSC, ES-08034 Barcelona, Spain
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2004年 / 41卷 / 03期
关键词：
noise-parameters measurement; FET noise parameters; FET distributed noise model; intrinsic noise-correlation matrix; noise modeling;
D O I：
10.1002/mop.20099
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise-correlation matrix of an elemental section of the device front the device's noise figure, measured for only one source-impedance state at a number of frequency points. Experimental results tip to 40 GHz are given. (C) 2004 Wiley Periodicals. Inc.
引用
收藏
页码：221 / 225
页数：5
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