A method for the determination of a distributed fet noise model based on matched-source noise-figure measurements

被引：0

作者：

Maya, MC ^{[1
]}

Lázaro, A ^{[1
]}

Pradell, L ^{[1
]}

机构：

[1] Univ Politecn Cataluna, Dept TSC, ES-08034 Barcelona, Spain

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2004年 / 41卷 / 03期

关键词：

noise-parameters measurement; FET noise parameters; FET distributed noise model; intrinsic noise-correlation matrix; noise modeling;

D O I：

10.1002/mop.20099

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise-correlation matrix of an elemental section of the device front the device's noise figure, measured for only one source-impedance state at a number of frequency points. Experimental results tip to 40 GHz are given. (C) 2004 Wiley Periodicals. Inc.

引用

页码：221 / 225

页数：5

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