Application of helium ion microscopy to nanostructured polymer materials

Helium ion microscopy (HIM) is a relatively new high-resolution nanotechnology imaging and nanofabrication tool. HIM offers a near-molecular resolution (approaching that of TEM) combined with a simplicity of sample preparation and high depth of field similar to SEM. Simultaneously, the technique is not limited by the surface roughness as scanning probe microscopy (SPM) techniques or by the surface charging or radiation damage like SEM. In our review, we consider general principles, advantages, and prospects of HIM application in polymer science. Examples of high-resolution imaging of polymer-based nanocomposites, polymer nanoparticles, nanofibers, nanoporous materials, polymer nanocrystals, biopolymers, and polymer-based photovoltaic and sensor devices are presented. We compare the HIM's applicability with other modern imaging techniques: SPM and SEM.