Dynamic thermo-mechanical properties of evaporated TiNi shape memory thin film

被引:24
|
作者
Makino, E [1 ]
Shibata, T [1 ]
Kato, K [1 ]
机构
[1] Hokkaido Univ, Grad Sch Engn, Sapporo, Hokkaido 0608628, Japan
关键词
shape memory alloy; TiNi thin film; flash evaporation; shape recovery; dynamic response; bulge test;
D O I
10.1016/S0924-4247(99)00222-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The shape recovery and re-deflection responses of shape memory alloy (SMA) thin film to thermal cycles were investigated using the bulge method. It was deposited by flash evaporation and had a nominal composition of 50 at.% Ti-50 at.% Ni and a thickness of about 6 mu m. After being released from silicon substrates and undergoing vacuum-annealing to obtain memorisation of an initial flat shape, it was deformed into a cap shape of 5 mm in diameter by pressurisation at 400 kPa. Then, by applying 100 ms voltage pulses, its initial shape was recovered by resistive heating at various energies. During these shape recovery and re-deflection cycles, change in displacement with time was measured continuously using a laser displacement meter. The thin film exhibited shape recovery at energies for heating of more than 1 J due to reverse martensitic transformation. Displacement due to shape recovery increased with increasing energy for heating, reaching saturation at around 100 mu m at energies of more than 2 J. After healing was completed, the thin film deflected again due to martensitic transformation under pressure. The period for each shape recovery and re-deflection cycle was about 600 ms at an energy of 2.1 J. It exhibited stable shape recovery and re-deflection properties at lip to 1000 cycles, which was the maximum number of thermal cycles rested. Finally, the pumping pressures and flow rates which might be expected with such an SMA micropump were also roughly estimated. (C) 1999 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:163 / 167
页数:5
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