Near ambient pressure photoelectron spectro-microscopy: from gas-solid interface to operando devices

被引：9

作者：

Amati, Matteo ^{[1
]}

Gregoratti, Luca ^{[1
]}

Zeller, Patrick ^{[1
,8
,9
,10
]}

Greiner, Mark ^{[2
]}

Scardamaglia, Mattia ^{[3
]}

Junker, Benjamin ^{[4
,5
]}

Russ, Tamara ^{[4
,5
]}

Weimar, Udo ^{[4
,5
]}

Barsan, Nicolae ^{[4
,5
]}

Favaro, Marco ^{[6
]}

Alharbi, Abdulaziz ^{[7
]}

Jensen, Ingvild J. T. ^{[8
]}

Ali, Ayaz ^{[8
]}

Belle, Branson D. ^{[8
]}

机构：

[1] Elettra Sincrotrone Trieste SCpA Interesse Nazl, SS 14 Km 163-5, I-34149 Trieste, Basovizza, Italy

[2] Max Planck Inst Chem Energy Convers, Dept Heterogeneous React, Surface Anal Grp, D-45470 Mulheim, Germany

[3] Lund Univ, MAX Lab 4, Box 118, S-22100 Lund, Sweden

[4] Univ Tubingen, Inst Phys & Theoret Chem IPTC, Morgenstelle 15, D-72076 Tubingen, Germany

[5] Univ Tubingen, Ctr Light Matter Interact Sensors & Analyt LISA, Morgenstelle 15, D-72076 Tubingen, Germany

[6] Helmholtz Zentrum Berlin Mat & Energie, Inst Solar Fuels, Hahn Meitner Pl 1, D-14109 Berlin, Germany

[7] King Abdulaziz City Sci & Technol KACST, POB 6086, Riyadh 11442, Saudi Arabia

[8] SINTEF, Forskningsveien 1, N-0373 Oslo, Norway

[9] Helmholtz Zentrum Berlin Mat & Energie GmbH, BESSY II, Albert Einstein Str 15, D-12489 Berlin, Germany

[10] Max Planck Gesell, Fritz Haber Inst, Dept Inorgan Chem, Faradayweg 4-6, D-14195 Berlin, Germany

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2021年 / 54卷 / 20期

基金：

欧盟地平线“2020”;

关键词：

photoemission; near ambient pressure XPS; photoelectron spectromicroscopy; SPEM; oxidation; 2D materials; gas-solid interfaces;

D O I：

10.1088/1361-6463/abe5e2

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Near ambient pressure scanning photoelectron microscopy adds to the widely used photoemission spectroscopy and its chemically selective capability two key features: (1) the possibility to chemically analyse samples in a more realistic gas pressure condition and (2) the capability to investigate a system at the relevant spatial scale. To achieve these goals the approach developed at the ESCA Microscopy beamline at the Elettra Synchrotron facility combines the submicron lateral resolution of a Scanning Photoelectron Microscope with a custom designed Near Ambient Pressure Cell where a gas pressure up to 0.1 mbar can be achieved. In this manuscript a review of experiments performed with this unique setup will be presented to illustrate its potentiality in both fundamental and applicative research such as the oxidation reactivity and gas sensitivity of metal oxides and semiconductors. In particular, the capability to perform operando experiments with this setup opens the possibility to study operating devices and to properly address the real nature of the studied systems, because if microscopy and spectroscopy are simultaneously combined in a single technique it can yield to more conclusive results.

引用

页数：14

共 68 条

[1] Scanning Photoelectron Microscopy: a Powerful Technique for Probing Micro and Nano-Structures [J].