An approach to measure the densities of solids using an artificial neural network

被引：1

作者：

Neelamegam, P.

Rajendran, A. ^{[1
]}

机构：

[1] Nehru Mem Coll Autonomous, PG & Res Dept Appl Phys, Tiruchirappalli, Tamil Nadu, India

[2] Deemed Univ, SASTRA, Dept Elect & Instrumentat Engn, Thanjavur, Tamil Nadu, India

来源：

INSTRUMENTATION SCIENCE & TECHNOLOGY | 2007年 / 35卷 / 02期

关键词：

density measurement; temperature measurement; microcontroller; neural network; back propagation algorithm;

D O I：

10.1080/10739140601126452

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A dedicated microcontroller based density measurement system is developed to measure densities of solids. A data acquisition system is designed and fabricated using a PIC16F877 microcontroller. To measure the weight and temperature of the sample, strain gauge and thermocouple sensors are used. A three layer neural network is used to train the data for atomic number, temperature, and density of sample using a back propagation algorithm. After training the neural network, it is used to compute the density at various temperatures.

引用

页码：189 / 199

页数：11

共 13 条

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