An approach to measure the densities of solids using an artificial neural network

被引：1
|
作者：
Neelamegam, P.
Rajendran, A. [1 ]
机构：
[1] Nehru Mem Coll Autonomous, PG & Res Dept Appl Phys, Tiruchirappalli, Tamil Nadu, India
[2] Deemed Univ, SASTRA, Dept Elect & Instrumentat Engn, Thanjavur, Tamil Nadu, India
来源：
INSTRUMENTATION SCIENCE & TECHNOLOGY | 2007年 / 35卷 / 02期
关键词：
density measurement; temperature measurement; microcontroller; neural network; back propagation algorithm;
D O I：
10.1080/10739140601126452
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A dedicated microcontroller based density measurement system is developed to measure densities of solids. A data acquisition system is designed and fabricated using a PIC16F877 microcontroller. To measure the weight and temperature of the sample, strain gauge and thermocouple sensors are used. A three layer neural network is used to train the data for atomic number, temperature, and density of sample using a back propagation algorithm. After training the neural network, it is used to compute the density at various temperatures.
引用
收藏
页码：189 / 199
页数：11
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