Maximal Independent Fault Set for Gate-Exhaustive Faults

被引：14

作者：

Pomeranz, Irith ^{[1
]}

机构：

[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2021年 / 40卷 / 03期

关键词：

Circuit faults; Logic gates; Compaction; Test pattern generators; Measurement; Benchmark testing; Layout; Gate-exhaustive faults; independent fault set; test compaction; test generation;

D O I：

10.1109/TCAD.2020.3003289

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Dynamic test compaction procedures use independent fault sets to guide the generation of compact test sets. In addition, a maximal independent fault set provides a lower bound on the number of tests, and can thus be used for evaluating the level of test compaction. This article notes that defect-aware, cell-aware, and gate-exhaustive faults have certain properties that can be used in the computation of independent fault sets. This article focuses on gate-exhaustive faults and the computation of a maximal independent fault set. The experimental results for benchmark circuits support the discussion.

引用

页码：598 / 602

页数：5

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