2019 atomic spectrometry update - a review of advances in X-ray fluorescence spectrometry and its special applications

被引：29

作者：

Vanhoof, Christine ^{[1
]}

Bacon, Jeffrey R. ^{[2
]}

Ellis, Andrew T. ^{[3
]}

Fittschen, Ursula E. A. ^{[4
]}

Vincze, Laszlo ^{[5
]}

机构：

[1] Flemish Inst Technol Res VITO, Boeretang 200, B-2400 Mol, Belgium

[2] 59 Arnhall Dr, Westhill AB32 6TZ, Aberdeen, Scotland

[3] 8 Burgess Close, Abingdon OX14 3JT, Oxon, England

[4] Tech Univ Clausthal, Inst Inorgan & Analyt Chem, Arnold Sommerfeld Str 4, D-38678 Clausthal Zellerfeld, Germany

[5] Univ Ghent, Dept Chem, Krijgslaan 281 S12, B-9000 Ghent, Belgium

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 2019年 / 34卷 / 09期

关键词：

IMAGING SPECTROSCOPY; MICRO-XRF; MA-XRF; SAMPLE PREPARATION; CONFOCAL XRF; NANOPARTICLES; SILVER; IDENTIFICATION; REFLECTOMETRY; CALIBRATION;

D O I：

10.1039/c9ja90042j

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

This review describes advances in the XRF group of techniques published approximately between April 2018 and March 2019. The review is selective with the aim of providing a critical insight into developments in instrumentation, methodologies and data handling that represent a significant advance in XRF spectrometry. It is not the intention of the review to cover comprehensively the applications of XRF techniques except in those cases where the non-destructive and remote sensing nature of XRF analysis makes it particularly valuable and the method of choice. These applications concern samples which are irreplaceable and of great cultural value such as works of art and archaeological artefacts.

引用

页码：1750 / 1767

页数：18

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