Study of Degradation Prediction Technology for Valve-Regulated Lead-Acid Batteries

被引：0
|
作者：
Wakaki Hiroshi [1 ]
Uno Yusuke [1 ]
Susuki Nobuhiko [1 ]
Matsushita Takashi [1 ]
Matsumura Shoji [2 ]
机构：
[1] NTT Facil Inc, Tokyo, Japan
[2] NTT Facil Res Inst Inc, Tokyo, Japan
来源：
2015 IEEE INTERNATIONAL TELECOMMUNICATIONS ENERGY CONFERENCE (INTELEC) | 2015年
关键词：
Degradation prediction technology; VRLA; BMS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
NTT Facilities has studied a degradation prediction technology for Valve-Regulated Lead-Acid Batteries which makes use of data obtained from a lead storage battery management system. This paper reports functions and effectiveness of the degradation prediction technology.
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页数：4
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