March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults

被引：3

作者：

Masnita, M. I. ^{[1
]}

Zuh, W. H. W. ^{[1
]}

Sidek, R. M. ^{[1
]}

Izhal, A. H. ^{[1
]}

机构：

[1] Univ Putra Malaysia, Dept Elect & Elect Engn, Fac Engn, Serdang 43400, Selangor Darul, Malaysia

来源：

IEICE ELECTRONICS EXPRESS | 2009年 / 6卷 / 15期

关键词：

SRAM testing; march tests; march-based diagnostic algorithm; Functional Fault Models (FFMs); Stuck-At Faults (SAF); transition faults;

D O I：

10.1587/elex.6.1091

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

March tests have been widely used for detecting functional faults during SRAM testing. Recent development has extended the March test for diagnostic purpose to locate and identify the fault types. This paper analyses March algorithms for detection and diagnosis of Stuck-At Faults (SAFs) and Transition Faults (TFs). Unfortunately, the algorithms under studied are not able to distinguish between the two faults. Therefore, this paper proposes a new March-based diagnostic algorithm that can differentiate SAFs from TFs.

引用

页码：1091 / 1097

页数：7

共 9 条

[1] Bergfeld T. J., 2000, Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537), P305, DOI 10.1109/DATE.2000.840288
[2] March SS: A test for all static simple RAM faults
Hamdioui, S
van de Goor, AJ
Rodgers, M
[J]. PROCEEDING OF THE 2002 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING, 2002, : 95 - 100
[3] An experimental analysis of spot defects in SRAMs: Realistic fault models and tests
Hamdioui, S
van de Goor, AJ
[J]. PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000), 2000, : 131 - 138
[4] Minimal march tests for unlinked static faults in Random Access Memories
Harutunyan, G
Vardanian, VA
Zorian, Y
[J]. 23RD IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2005, : 53 - 59
[5] On comparing functional fault coverage and defect coverage for memory testing
Kim, VK
Chen, T
[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1999, 18 (11) : 1676 - 1683
[6] March-based RAM diagnosis algorithms for stuck-at and coupling faults
Li, JF
Cheng, KL
Huang, CT
Wu, CW
[J]. INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS, 2001, : 758 - 767
[7] Van De Goor A. J, 1998, Testing Semiconductor Memories: Theory and Practice
[8] A March-based fault location algorithm for Static random access memories
Vardanian, VA
Zorian, Y
[J]. PROCEEDING OF THE 2002 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING, 2002, : 62 - 67
[9] YARMOLIK VN, 1996, 1996 IEEE INT WORKSH, P100

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