Selective wet etching of p-GaN for efficient GaN-based-light-emitting diodes

被引:96
作者
Na, Seok-In [1 ]
Ha, Ga-Young
Han, Dae-Seob
Kim, Seok-Soon
Kim, Ja-Yeon
Lim, Jae-Hong
Kim, Dong-Joon
Min, Kyeong-Ik
Park, Seong-Ju
机构
[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea
[2] Gwangju Inst Sci & Technol, Natl Res Lab Nanophoton Semicond, Kwangju 500712, South Korea
[3] Samsung Electromech Co Ltd, Suwon 442743, South Korea
关键词
GaN; leakage currents; light-emitting diodes (LEDs); light-output power; selective wet etching;
D O I
10.1109/LPT.2006.877562
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The selective, wet etching of a p-GaN layer by using a solution of KOH in ethylene glycol (KE) was studied to enhance the optical and electrical performance of the GaN-based light-emitting diodes (LEDs). The surface of the p-GaN, which was selectively etched in the KE solution, showed hexagonal-shaped etch pits. The light-output power of etched LEDs was improved by 29.4% compared to that of the nonetched LED. This improvement was attributed to the increase in the probability of photons to escape due to the increased surface area of textured surface and the reduction in contact resistance of the ohmic layer resulting from the increased contact area and hole concentration on the textured p-GaN. The reverse leakage current of the LED was also greatly decreased due to the surface passivation and the removal of defective regions from the p-GaN.
引用
收藏
页码:1512 / 1514
页数:3
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