ZnO as Transparent Conducting Oxide by Atomic Layer Deposition

被引:0
|
作者
Sinha, Soumyadeep [1 ]
Sarkar, Shaibal K. [1 ]
机构
[1] Indian Inst Technol, Dept Energy Sci & Engn, Bombay 400076, Maharashtra, India
关键词
Atomic Layer Deposition (ALD); In-situ growth; Transparent conducting oxide (TCO); Zinc Oxide; THIN-FILMS; GROWTH;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Zinc Oxide (ZnO) films were deposited on SiO2/Si and glass substrates by Atomic Layer Deposition using Diethylzinc (DEZ) as the metal precursor and Water (H2O) as the oxidant over a temperature range of 75 degrees C to 225 degrees C. Here we demonstrated self limiting behavior of the Atomic Layer Deposition and the linear growth of the deposited films by in-situ quartz crystal microbalance (QCM) study. The maximum growth rate was found to be similar to 1.8 to 2 angstrom per ALD cycle. The as deposited crystalline ZnO films were found to be c-axis preferentially oriented with dense microstructures, homogeneous grain sizes and low surface roughness. We developed ZnO as similar to 80% transparent conductor with carrier density ca. 10(21) cm(-3) and a controllable resistivity from the intrinsic level (highly insulating) to 10(-3) Omega-cm without any intentional doping.
引用
收藏
页码:1183 / 1186
页数:4
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