Local Analyses of Ionic Liquid/Solid Interfaces by Frequency Modulation Atomic Force Microscopy and Photoemission Spectroscopy

被引：27

作者：

Fukui, Ken-ichi ^{[1
]}

Yokota, Yasuyuki ^{[1
]}

Imanishi, Akihito ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn Sci, Dept Mat Engn Sci, Toyonaka, Osaka 5608531, Japan

来源：

CHEMICAL RECORD | 2014年 / 14卷 / 05期

基金：

日本学术振兴会;

关键词：

electrochemistry; interfaces; ionic liquids; photoemission spectroscopy; scanning probe microscopy; RAY PHOTOELECTRON-SPECTROSCOPY; DOUBLE-LAYER STRUCTURE; LIQUIDS IN-VACUO; ELECTRODE INTERFACE; SURFACE; TEMPERATURE; CRYSTAL; ENERGY; HYSTERESIS; TRANSPORT;

D O I：

10.1002/tcr.201402032

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Local analyses of ionic liquid/solid electrode interfaces at a controlled electrode potential are of fundamental importance to understanding the origin and properties of the electric double layer at the interfaces, which is necessary for their application to electrochemical devices. This account summarizes our recent achievements of such analyses by using the novel analytical tools of electrochemical frequency modulation AFM (EC-FM-AFM) and electrochemical photoemission spectroscopy (EC-PES). Rather stable stepped structures composed of layers of ion pairs and softer solvation layers outside of the imaged layer were clearly visualized by FM-AFM depending on the substrates. An extremely extended diffusion layer was directly observed by EC-PES during the electrodeposition of metal ion solutes.

引用

页码：964 / 973

页数：10

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