Preparation, characterization and dielectric properties of Ba5LnZnTa9O30 (Ln = La, Sm) ceramics

被引：36

作者：

Fang, L ^{[1
]}

Zhang, H ^{[1
]}

Yang, JF ^{[1
]}

Yuan, RZ ^{[1
]}

Liu, HX ^{[1
]}

机构：

[1] Wuhan Univ Technol, State Key Lab Adv Technol Mat Synth & Proc, Wuhan 430070, Peoples R China

来源：

MATERIALS RESEARCH BULLETIN | 2004年 / 39卷 / 4-5期

基金：

中国国家自然科学基金;

关键词：

oxides; electronic materials; X-ray diffraction; dielectric properties;

D O I：

10.1016/j.materresbull.2003.12.004

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ba(5)LnZnTa(9)O(30) (Ln = La, Sm) ceramics were prepared by high temperature solid-state reaction route. The samples were characterized by X-ray diffraction, scanning electron microscopy (SEM), and differential scanning calorimetry (DSC) methods. They belong to paraelectric phase of filled tetragonal TB structure at room temperature with unit cell a = 12.5909(4) Angstrom, c = 3.9622(2) Angstrom for Ba5LaZnTa9O30; and a = 12.5777(4) Angstrom, c = 3.9544(2) Angstrom for Ba5SmZnTa9O30. At 1 MHz, Ba5LaZnTa9O30 has high dielectric constants of 89 with low dielectric loss 0.0067, and temperature coefficients of the dielectric constant (tau(epsilon)) - 811 ppm degreesC(-1); Ba5LaZnTa9O30 has dielectric constants of 74 with low dielectric loss 0.0035, and tau(epsilon) -474 ppm degreesC(-1). (C) 2004 Elsevier Ltd. All rights reserved.

引用

页码：677 / 682

页数：6

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