Single grating phase contrast imaging for x-ray microscopy and microtomography

The grating based approach to phase contrast imaging is rather inefficient in the use of the available x-ray flux due to the presence of two absorption gratings and it requires longer scan times compared to conventional CT because multiple images are needed at each projection angle. To avoid these drawbacks, a proof-of-principle experiment was developed to obtain absorption, phase contrast (DPC) and dark field images (DCI) in a single exposure using only a non-absorbing phase grating, a micro-focus source in cone-beam geometry and a high-resolution x-ray detector.