Study of SU-8 reliability in wet thermal ambient for application to polymer micro-optics on VCSELs

被引:6
作者
Reig, Benjamin [1 ,2 ]
Bardinal, Veronique [1 ,2 ]
Doucet, Jean-Baptiste [1 ,2 ]
Daran, Emmanuelle [1 ,2 ]
Camps, Thierry [1 ,3 ]
Aufray, Maelenn [4 ]
Lamure, Alain [4 ]
Tendero, Claire [4 ]
机构
[1] CNRS, LAAS, F-31400 Toulouse, France
[2] Univ Toulouse, LAAS, F-31400 Toulouse, France
[3] Univ Toulouse, LAAS, UPS, F-31400 Toulouse, France
[4] Univ Toulouse, UPS, CNRS, INPT, F-31030 Toulouse, France
关键词
MEMS; PHOTORESIST; TECHNOLOGY; QUALITY; FAILURE; SYSTEMS; LENSES;
D O I
10.7567/JJAP.53.08MC03
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present experimental data on the reliability of SU-8 polymer when used as a core material for the integration of microlenses on vertical-cavity surface-emitting lasers (VCSELs). The respective effects of a hot and humid environment on structural, mechanical and optical properties of this epoxy resist are investigated. High aspect-ratio SU-8 micropillars are found to keep a good surface morphology and a stable optical transmission, as well as a good adherence on the wafer. Thermal cycling is also studied to check material stability under electro-thermal actuation in SU-8 micro-opto-electro-mechanical system (MOEMS). These results are of great importance for the collective integration of low-cost SU-8-based passive or active microlens arrays onto VCSELs wafers for optical interconnects and optical sensing applications. (C) 2014 The Japan Society of Applied Physics
引用
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页数:5
相关论文
共 24 条
[21]   Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip [J].
Salm, Cora ;
Carballo, Victor M. Blanco ;
Melai, Joost ;
Schmitz, Jurriaan .
MICROELECTRONICS RELIABILITY, 2008, 48 (8-9) :1139-1143
[22]   QUALITY ENGINEERING (TAGUCHI METHODS) FOR THE DEVELOPMENT OF ELECTRONIC CIRCUIT-TECHNOLOGY [J].
TAGUCHI, G .
IEEE TRANSACTIONS ON RELIABILITY, 1995, 44 (02) :225-229
[23]   High power and good beam quality of two-dimensional VCSEL array with integrated GaAs microlens array [J].
Wang, Zhenfu ;
Ning, Yongqiang ;
Zhang, Yan ;
Shi, Jingjing ;
Zhang, Xing ;
Zhang, Lisen ;
Wang, Wei ;
Liu, Di ;
Hu, Yongsheng ;
Cong, Haibing ;
Qin, Li ;
Liu, Yun ;
Wang, Lijun .
OPTICS EXPRESS, 2010, 18 (23) :23900-23905
[24]   Failure mode analysis of oxide VCSELs in high humidity and high temperature [J].
Xie, SN ;
Herrick, RW ;
Chamberlin, D ;
Rosner, SJ ;
McHugo, S ;
Girolami, G ;
Mayonte, M ;
Kim, S ;
Widjaja, W .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 2003, 21 (04) :1013-1019