Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

被引：9

作者：

Andricek, Ladislav ^{[2
]}

Dolezal, Zdenek ^{[1
]}

Drasal, Zbynek ^{[1
]}

Fischer, Peter ^{[3
]}

Kodys, Peter ^{[1
]}

Kohrs, Robert ^{[4
]}

Kvasnicka, Peter ^{[1
]}

Marinas, Carlos ^{[5
]}

Reuen, Lars ^{[4
]}

Rummel, Stefan ^{[2
]}

Schmieden, Kristof ^{[4
]}

Velthuis, Jaap J. ^{[6
]}

Vos, Marcel ^{[5
]}

机构：

[1] Charles Univ Prague, Fac Math & Phys, CR-18000 Prague, Czech Republic

[2] MPI Phys, D-80805 Munich, Germany

[3] Univ Heidelberg, Inst Comp Ingn, D-68131 Mannheim, Germany

[4] Univ Bonn, Inst Phys, D-53115 Bonn, Germany

[5] Inst Fis Corpuscular, E-46071 Valencia, Spain

[6] Univ Bristol, HH Well Phys Lab, Bristol BS8 4DN, Avon, England

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2009年 / 604卷 / 1-2期

关键词：

Silicon pixel detectors; Detector resolution; Laser test; Beam test; eta-Correction; Multiple scattering;

D O I：

10.1016/j.nima.2009.01.097

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Pixel sensors with micron resolution are being developed by several groups, and this development comes hand in hand with the development of new resolution enhancement methods specially suited to the new sensors. This paper summarizes the results of our study of hit reconstruction methods used in analysis of Depleted P-Channel Field Effect Transistor (DEPFET) beam test data. The study is based on data of DEPFET beam tests at CERIN in 2006 and 2007. and on laser tests using a pulsed 682 nm laser. In beam test data analysis, we used a new method to separate the contributions of intrinsic resolution, multiple scattering and track uncertainty to impact point prediction error. We compared several methods of hit reconstruction for pixel detectors, based either on beam test tracks or on laser matrix scans for a range of laser pulse energies. We show about 20% improvement in the resolutions calculated from the data of two DEPFET beam tests with different detector setups. We also show that impact point correction derived from laser tests can be applied in tracking. (c) 2009 Elsevier B.V. All rights reserved.

引用

页码：385 / 389

页数：5

共 5 条

[1]

ANDRICEK L, 2007, DEPFET PIXEL VERTEX

[2]

DOLEZAL Z, 200810 EUDET

[3]

DRASAL Z, 2006, THESIS CHARLES U PRA

[4] SPATIAL-RESOLUTION OF SILICON MICROSTRIP DETECTORS [J].

TURCHETTA, R .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1993, 335 (1-2) :44-58

[5] A DEPFET based beam telescope with submicron precision capability [J].

Velthuis, J. J. ;

Drasal, Z. ;

Hanninger, G. ;

Kohrs, R. ;

Mathes, M. ;

Reuen, L. ;

Scheirich, D. ;

Andricek, L. ;

Pascual, I. Carbonell ;

Chen, X. ;

Dolezal, Z. ;

Fischer, P. ;

Frey, A. ;

Fuster, J. A. ;

Koch, M. ;

Kodys, P. ;

Kvasnicka, P. ;

Krueger, H. ;

Llacer, C. Lacasta ;

Lodomez, P. ;

Moser, H. G. ;

Peric, I. ;

Raspereza, A. ;

Richter, R. ;

Rummel, S. ;

von Toerne, E. ;

Wermes, N. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (01) :662-666

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