Wavelength extended InGaAs/InAlAs/InP photodetectors using n-on-p configuration optimized for back illumination

被引:25
作者
Zhang, Yonggang [1 ]
Gu, Yi [1 ]
Tian, Zhaobing [1 ]
Li, Aizhen [1 ]
Zhu, Xiangrong [1 ]
Wang, Kai [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
关键词
Photodetectors; III-V compounds; Molecular beam epitaxy; Short wavelength infrared; VAPOR-PHASE EPITAXY; DARK CURRENT; INGAAS PHOTODETECTORS; INFRARED DETECTORS; PHOTODIODES; EFFICIENCY; BUFFER; MOCVD;
D O I
10.1016/j.infrared.2008.12.001
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Using n-on-p InGaAs/InAlAs/InP heterojunction structure with relative thin Be doped linearly graded InxAl1-xAs as buffer layer, wavelength extended InGaAs photodiodes with 50% cutoff wavelength of 2.0 mu m and 2.4 mu m at room temperature have been grown by using gas source MBE with a convenient but reliable correlative ramping procedure, and their dark current performance in a wide temperature range have been investigated. For 300 pm diameter detectors at 290 K, typical R(0)A and dark current at 10 mV reverse bias are 760 Omega cm(2)/11.3 nA for cutoff wavelength of 2.0 mu m, and 104 Omega cm(2)/75.1 nA for cutoff wavelength of 2.4 mu m. Room temperature peak cletectivity D lambda P center dot reaches 13E11 cm Hz(1/2)/W and 6.5E10 cm Hz(1/2)/W, respectively measured using 900 K black body source. For back illumination the parameter optimization of n-on-p configuration is much easier than those of p-on-n, also the structure quality of the n-on-p is better than those of p-on-n because of the high Be doping in the linear graded buffer layer instead of Si. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:52 / 56
页数:5
相关论文
共 20 条
[1]  
COHEN MJ, 1993, P SOC PHOTO-OPT INS, V1946, P436, DOI 10.1117/12.158695
[2]   Dark current optimisation for MOVPE grown 2.51μm wavelength InGaAs photodetectors [J].
D'Hondt, M ;
Moerman, I ;
Demeester, P .
ELECTRONICS LETTERS, 1998, 34 (09) :910-912
[3]   Influence of buffer layer and processing on the dark current of 2.5μm-wavelength 2%-mismatched InGaAs photodetectors [J].
D'Hondt, M ;
Moerman, I ;
Van Daele, P ;
Demeester, P .
IEE PROCEEDINGS-OPTOELECTRONICS, 1997, 144 (05) :277-282
[4]   GA1-XINXAS INASYP1-Y INP PHOTODIODES FOR THE 1.6 TO 2.4 MU-M SPECTRAL REGION GROWN BY LOW-PRESSURE MOCVD [J].
DIFORTEPOISSON, MA ;
BRYLINSKI, C ;
DIPERSIO, J ;
HUGON, X ;
VILOTITCH, B ;
LENOBLE, C .
JOURNAL OF CRYSTAL GROWTH, 1992, 124 (1-4) :782-791
[5]   Extended wavelength InGaAs infrared (1.0-2.4 μm) detector arrays on SCIAMACHY for space-based spectrometry of the Earth atmosphere [J].
Hoogeveen, RWM ;
van der A, RJ ;
Goede, APH .
INFRARED PHYSICS & TECHNOLOGY, 2001, 42 (01) :1-16
[6]   Extended wavelength InGaAs on GaAs hybrid image sensors [J].
John, J ;
Zimmermann, L ;
Merken, P ;
de Groote, S ;
Borghs, G ;
Van Hoof, C ;
Nemeth, S ;
Colin, T .
INFRARED SPACEBORNE REMOTE SENSING XI, 2003, 5152 :263-270
[7]   Recent advances in InGaAs detector technology [J].
Kaniewski, J ;
Muszalski, J ;
Piotrowski, J .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2004, 201 (10) :2281-2287
[8]   In-flight proton-induced radiation damage to SCIAMACHY's extended-wavelength InGaAs near-infrared detectors [J].
Kleipool, Q. L. ;
Jongma, R. T. ;
Gloudemans, A. M. S. ;
Schrijver, H. ;
Lichtenberg, G. F. ;
van Hees, R. M. ;
Maurellis, A. N. ;
Hoogeveen, R. W. M. .
INFRARED PHYSICS & TECHNOLOGY, 2007, 50 (01) :30-37
[9]   DARK CURRENT ANALYSIS AND CHARACTERIZATION OF INXGA1-XAS/INASYP1-Y GRADED PHOTODIODES WITH X-GREATER-THAN-0.53 FOR RESPONSE TO LONGER WAVELENGTHS (GREATER-THAN-1.7-MU-M) [J].
LINGA, KR ;
OLSEN, GH ;
BAN, VS ;
JOSHI, AM ;
KOSONOCKY, WF .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1992, 10 (08) :1050-1055
[10]   GA1-YINYAS/INASXP1-X (Y-GREATER-THAN-0.53, X-GREATER-THAN-0) PIN PHOTODIODES FOR LONG WAVELENGTH REGIONS (LAMBDA-GREATER-THAN-2-MU-M) GROWN BY HYDRIDE VAPOR-PHASE EPITAXY [J].
MAKITA, K ;
TORIKAI, T ;
ISHIHARA, H ;
TAGUCHI, K .
ELECTRONICS LETTERS, 1988, 24 (07) :379-380