Error analysis about CCD sampling in Fourier transform profilometry

被引:11
作者
Chen, Wenjing [1 ]
Li, Manhai [1 ]
Su, Xianyu [1 ]
机构
[1] Sichuan Univ, Dept Optoelect, Chengdu 610064, Peoples R China
来源
OPTIK | 2009年 / 120卷 / 13期
关键词
Fourier transform profilometry; CCD sampling; Frequency aliasing; AUTOMATIC-MEASUREMENT; OBJECT SHAPES;
D O I
10.1016/j.ijleo.2008.02.012
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The influence of sampling caused by 2-D solid-state image sensors (CCD) in FTP is discussed in this paper. As we all know, discrete fringe patterns processed by computer are obtained through two samplings. The first one is accomplished in the CCD image plane, and the second is accomplished in A/D convertor of frame grabber. In the previous analysis, sampling is just regarded as a point-sampling process because of ignoring the actual sensor structure of a CCD in the sampling process. Here we discuss the influence of the sensor structure of CCD in FTP, especially the influence from the light-sensitive area size variation. Certain formulas about sampling influence are given, and some simulations and a primary experimental demonstration are carried out to verify our analysis. (C) 2008 Elsevier GmbH. All rights reserved.
引用
收藏
页码:652 / 657
页数:6
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