A connection between uniformity and aberration in regular fractions of two-level factorials

被引:103
作者
Fang, KT [1 ]
Mukerjee, R
机构
[1] Hong Kong Baptist Univ, Dept Math, Hong Kong, Hong Kong, Peoples R China
[2] Indian Inst Management, Calcutta 700027, W Bengal, India
关键词
centred L-2-discrepancy; fractional factorial design; minimum aberration; uniformity; wordlength pattern;
D O I
10.1093/biomet/87.1.193
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
We show a link between the two apparently unrelated areas of uniformity and minimum aberration. With reference to regular fractions of two-level factorials, we derive an expression for the centred L-2-discrepancy measure for uniformity in terms of the word-length pattern. This result indicates, in particular; excellent behaviour of minimum aberration designs with regard to uniformity and provides further justification for the popular criterion of minimum aberration.
引用
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页码:193 / 198
页数:6
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