Extended X-ray Absorption Fine Structure Data Analysis of Cu (II) Complexes

A technique is presented for Extended X-ray absorption fine structure (EXAFS) data analysis for determining the metal-ligand bond length using synchrotron source. In present work a fresh series of Copper complexes have been presented. Cu complexes are synthesized by chemical route method. The synthesized complexes were further characterized by X-ray diffraction (XRD). XRD analysis shows that sample is crystalline in nature and having particle size in the range of nano meters. These complexes have also been characterized by Cu K-Edge EXAFS measurements using the dispersive beam line at 2.5 GeV Indus-2 synchrotron radiation source at RRCAT (Raja Ramanna Centre for Advance Technology), Indore, India. The measured EXAFS data have been analyzed to compute average metal-ligand bond length using Levy's, LSS, Lytle's, Fourier transform methods, with the help of computer software ATHENA.