Thermistor behavior of PEDOT:PSS thin film

被引：38

作者：

Kwon, Il Woong ^{[1
]}

Son, Hyuck Jun ^{[1
]}

Kim, Woo Young ^{[1
]}

Lee, Yong Soo ^{[1
]}

Lee, Hee Chul ^{[1
,2
]}

机构：

[1] Korea Adv Inst Sci & Technol, Sch Elect Engn & Comp Sci, Taejon 305701, South Korea

[2] Natl Nanofab Ctr NNFC, Taejon 305806, South Korea

来源：

SYNTHETIC METALS | 2009年 / 159卷 / 12期

关键词：

Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS); Thermistor; CONDUCTIVITY; POLY(3,4-ETHYLENEDIOXYTHIOPHENE)/POLY(4-STYRENE-SULFONATE); ENHANCEMENT; MORPHOLOGY; SUBSTRATE; TRANSPORT; SOLVENT;

D O I：

10.1016/j.synthmet.2009.02.006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The temperature-dependent resistance changing characteristics (thermistor behaviors) of a poly(3,4-ethylenedioxythophene):poly(4-styrenesulfonate) (PEDOT:PSS) thin film are investigated in the 30-100 degrees C range using Greek-cross and bar patterns. The PEDOT:PSS film was spin-coated onto a Si wafer passivated with a SiO2 layer, and a conventional dry etching technique was used to pattern the PEDOT:PSS film in conjunction with a nitride etch mask layer. Cr/Au was used for the electrode material. It was found that the characteristic temperature (T-o) and resistivity of the PEDOT:PSS film have an inversely proportional relationship with the number of coatings and the number of interfaces between multiply coated PEDOT:PSS layers. It was also found that as the number of coatings and the number of the interfaces increase, lower temperature-dependent resistance changes are observed. The temperature coefficient of resistance (TCR) value of 60 nm thick PEDOT:PSS film was slightly larger than or comparable to that of a conventional metal (Au or Pt) thermistor. The possibility of utilizing the PEDOT:PSS thin film in thermistor applications is discussed. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1174 / 1177

页数：4

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