ZnGa2O4 deep-ultraviolet photodetector based on Si substrate

被引:24
|
作者
Lin, Wanmin [1 ]
Zhang, Dan [1 ]
Liu, Sixian [1 ]
Li, Yuqiang [1 ]
Zheng, Wei [1 ]
Huang, Feng [1 ]
机构
[1] Sun Yat Sen Univ, Sch Mat, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Peoples R China
关键词
ZnGa2O4; DUV PDs; Oxygen-rich conditions; Thin films; Deposition; PERFORMANCE;
D O I
10.1016/j.matlet.2020.128805
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Deep-ultraviolet photodetectors with fast response speed are urgently required in flame detection and atmospheric monitoring. A method for reducing oxygen vacancies in ZnGa2O4 films by high-temperature and oxygen thermodynamic conditions is proposed, to increase the response speed of ZnGa2O4/Si heterojunction deep-ultraviolet photodetectors. Here, a ZnGa2O4/Si heterojunction deep-ultraviolet photodetector with excellent performance is fabricated, exhibiting a decay time of similar to 67 ms, a dark current of 0.027 nA and a photo-to-dark current ratio of similar to 490. These results indicate that the high-temperature and oxygen-rich annealing method proposed here can provide a reference for the fabrication of ZnGa2O4 deep-ultraviolet photodetectors with excellent performance. (C) 2020 Elsevier B.V. All rights reserved.
引用
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页数:3
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