Application of k-NN based segmentation algorithm in system for automated measurement of surface phenomena

被引：1

作者：

Sankowski, D ^{[1
]}

Strzecha, K ^{[1
]}

机构：

[1] Tech Univ Lodz, Dept Comp Engn, PL-90924 Lodz, Poland

来源：

MODERN PROBLEMS OF RADIO ENGINEERING, TELECOMMUNICATIONS AND COMPUTER SCIENCE, PROCEEDINGS | 2002年

关键词：

image analysis; image segmentation; k-NN rule; surface phenomena; high temperature measurement;

D O I：

10.1109/TCSET.2002.1015945

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents application of new segmentation algorithm in computer-based system for high temperature measurements of superficial properties. This newly developed segmentation algorithm is based on statistical pattern recognition theory.

引用

页码：239 / 242

页数：4

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[7]

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[8]

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[9]

STRZECHA K, 2001, 6 INT IEEE C EXP DES, P200

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